WAFER PROBE PUBLICATIONS  

 

 

 
A 1.1 THz Micromachined On-Wafer Probe   PDF
 
Characterization of Micromachined On-Wafer Probes for the 600 – 900 GHz Waveguide Band   PDF
 
Improved Micromachined Terahertz On-Wafer Probe Using Integrated Strain Sensor    
    Measurement Uncertainty Characterization of Terahertz Large Wafer Probing    
    A W-band Balun Integrated Probe with Common Mode Matching Network    
    Micromachining of Submillimeter-Wave Calibration Standards    
    Characterization of submillimeter-wave Schottky diodes in the 500–750 GHz band using micromachined on-wafer probes    
    Micromachined probes for on-wafer measurement of millimeter- and submillimeter-wave devices and components    
    An Experimental Technique for Calibration Uncertainty Analysis    
    Integrated strain sensor for micromachined terahertz on-wafer probe    
    Improved Micromachined Terahertz On-Wafer Probe Using Integrated Strain Sensor    
    A Terahertz Micromachined On-Wafer Probe for WR-1.2 Waveguide   PDF
    Terahertz Micromachined On-Wafer Probes: Repeatability and Reliability    
    Micromachined probes for on-wafer characterization of terahertz and submillimeter-wave components    
    A Micromachined Terahertz Waveguide 90 degree Twist    
    Micromachined Probes for Submillimeter-Wave On-Wafer Measurements—Part I: Mechanical Design and Characterization    
    Micromachined Probes for Submillimeter-Wave On-Wafer Measurements—Part II: RF Design and Characterization    
    Terahertz micromachined on-wafer probes: Repeatability and robustness    
    Calibration accuracy of a 625 GHz on-wafer probe    
    Micromachined on-wafer probes    
       
   

 

 

     

 

 

             
         
         
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